Customized DUV+IR
Studies of Metal Cluster Structural Chemistry
Working members: Lijun Geng, Shiquan Lin
DUV-IR Laser Ionization Time-of-flight Mass Spectrometer
Based on the time-of-flight mass spectrometer(TOF-MS), this instrumentation, which utilizes all-solid-state deep ultraviolet(DUV) laser system and broadly tunable infrared(IR) laser, is able to identify the elemental composition and chemical structure of the samples, simultaneously and accurately.